Registrar’s Corner
Hi iLEAD Lancaster Families!
Welcome to the first edition of the Registrar’s Corner! My name is Brittany Ward, and I am the Registrar at iLEAD Lancaster. I am excited to share with you the many wonderful resources available here at iLEAD Lancaster.
Did you know that there are a number of ways to clear your child’s absence(s)?
- Call the Front Office at (661) 722-4287
- Click here to report it
- Email me at Brittany.Ward@ileadlancaster.org
- Leave a note to the Front Office. The note can be written by you or by a doctor.
Many of our families also utilize Short Term Independent Study (STIS). STIS is utilized when your child will be out of school for 3-10 consecutive school days. STIS is requested by the parent to me. I collect work from the Facilitator(s) for your child to complete while out of school, and the work is turned back in to me upon your child’s return. When STIS is utilized, the absences don’t count against your child AND they stay caught up on their classwork! That’s a Win-Win!
I look forward to sharing more useful knowledge with you in the weeks to come. Make sure to check your Monday Message every week for updates, resources, and information!
RECENT POSTS
Learner Outcome Reflection Survey Results Coming Soon to Your Inbox
At iLEAD, we believe that education should extend beyond traditional academic knowledge. Our purposeful approach revolves around the iLEAD Schoolwide Learner Outcomes, a collective vision that encapsulates our aspirations for… Read more
1st Graders Demonstrate Biology Knowledge in “Inside Out” Presentation of Learning
Our amazing 1st graders at iLEAD Lancaster just blew us away with their “Inside Out” Presentation of Learning! These brilliant young minds dove deep into the wonders of the human… Read more
Aeronautics and History Come to Life at iLEAD Lancaster
As part of their Soaring Aeronautics Project with iLEAD Student Aerospace Projects, 8th graders hosted a Presentation of Learning, showcasing their knowledge of famous aviators and the principles of flight.… Read more